VNIIFTRI presented a new measuring instrument of its own design for microelectronics

Moscow Region, June 26, 2025 —The Federal State Unitary Enterprise “Russian Metrological Institute of Technical Physics and Radio Engineering” (VNIIFTRI) of Rosstandart has developed a domestic measuring probe and calibration plate (board) for high-precision measurements of parameters of microelectronic devices on a substrate. The new device allows to perform accurate measurements at both the macro- and microscopic levels, which are especially in demand when working with radio frequency and high-frequency devices, as well as during assembly quality control and microelectronics materials research.

 "Expansion of domestic production of radio engineering systems and hardware complexes is impossible without advanced development of measuring technologies. As early as 2026, new probes developed by VNIIFTRI will become available for order, opening up additional opportunities to replace imported analogues and strengthening the country's technological independence in the field of electronic industry," says Sergey Donchenko, General Director of FSUE «VNIIFTRI».

VNIIFTRI measuring probe is designed for use in installations that measure S-parameters — reflection coefficients and power transmission — in microcircuits and integrated circuits. The calibration plate is used for calibration of vector circuit analyzers and plays a key role in control operations at all stages of modern electronics manufacturing.

"The development of our own measuring instruments and calibration plates is of strategic importance for domestic micro- and nanoelectronics. These solutions allow enterprises to minimize dependence on foreign components, ensure metrological traceability of measurements and meet the requirements of modern standards. This is especially important in the context of the rapid development of the microelectronic industry, growing overall production and demands to the quality for end products," says Alexander Bondarenko, Deputy Head of the Department of Measurements in radio frequency paths at FSUE “VNIIFTRI”, one of the developers of the new device.

Serial production of the new device is scheduled to begin in 2026. In addition, following the results of the XIV Scientific and Technical Conference "Metrology in Radio Electronics", a proposal was submitted to the Federal Agency for Technical Regulating and Metrology (Rosstandart) to establish a Working Group under the Commission on Radio Engineering Measurements, which will standardize the requirements for probe measurements of microelectronic structures on a plate.